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ACIGS solar cells are exposed to targeted radiation to probe the front and back interfaces of the absorber to assess the impact of space environments on these systems. These data suggest ACIGS cells are more radiation‐hard than early CIGS devices likely due to the lower defect densities and more ideal interfaces in the ACIGS system. A combination ofJ–Vand external quantum efficiency measurements indicates some improvement in the performance of the device due to the effects of local heating in the dominant ionizing electronic energy loss regime of proton irradiation that anneal the upper CdS/ACIGS interface. However, nonionizing energy losses at the base of the solar cell also appear to inhibit minority carrier collection from the back of the cell at the ACIGS/Mo interface, which is discussed in terms of defect‐mediated changes in the doping profile, the Ga/Ga+In ratio, and impurity composition after proton irradiation. 

Perovskite photovoltaics (PVs) are under intensive development for promise in terrestrial energy production. Soon, the community will find out how much of that promise may become reality. Perovskites also open new opportunities for lower cost space power. However, radiation tolerance of space environments requires appropriate analysis of relevant devices irradiated under representative radiation conditions. We present guidelines designed to rigorously test the radiation tolerance of perovskite PVs. We review radiation conditions in common orbits, calculate nonionizing and ionizing energy losses (NIEL and IEL) for perovskites, and prioritize proton radiation for effective nuclear interactions. Low-energy protons (0.05–0.15 MeV) create a representative uniform damage profile, whereas higher energy protons (commonly used in ground-based evaluation) require significantly higher fluence to accumulate the equivalent displacement damage dose due to lower scattering probability. Furthermore, high-energy protons may ‘‘heal’’ devices through increased electronic ionization. These procedural guidelines differ from those used to test conventional semiconductors.